The influence of neutron and gamma radiation on the reliability of magnetic and semiconductor memories

The miniaturization of computer facilities conditioned by the miniaturization

of applied components makes them very sensitive to radioactive radiation.

This is where neutron and electromagnetic radiation come to the fore. The

reason for the particularly pronounced effects of this radiation is the fact

that they do not interact with the Coulomb force, so they pass (leave) the

reactor vessel unimpeded. This study examines the reliability of magnetic

and semiconductor computer memories in the field of neutron and gamma

radiation. This study experimental, and conducted under well-controlled

conditions. The combined measurement uncertainty of the experimental

procedure is less than 5 %. Sophisticated methods of mathematical statistics

were used to process the stochastic results of measurements.