Non-parametric semi-supervised chiller fault diagnosis via variational compressor under severe few labeled samples
Non-parametric semi-supervised chiller fault diagnosis via variational compressor under severe few labeled samples
Huazheng Han,Xuejin Gao,3 Authors,Kexin Jiang
2025 · DOI: 10.1016/j.engappai.2025.110233
Engineering applications of artificial intelligence · 13 Citations