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Modern IC packaging trends and their reliability implications

R. Plieninger,M. Dittes,K. Pressel

2006 · DOI: 10.1016/j.microrel.2006.08.008
Microelectronics and reliability · 44 Citations

TLDR

For the future it is necessary that test conditions must follow the field requirements to guarantee optimum reliability results, and the importance of design for reliability based on results of simulations for a leadless package is highlighted.