Modern IC packaging trends and their reliability implications
Modern IC packaging trends and their reliability implications
R. Plieninger,M. Dittes,K. Pressel
2006 · DOI: 10.1016/j.microrel.2006.08.008
Microelectronics and reliability · 44 Citations
TLDR
For the future it is necessary that test conditions must follow the field requirements to guarantee optimum reliability results, and the importance of design for reliability based on results of simulations for a leadless package is highlighted.
