Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
Focused ion beam-based microfabrication of boron-doped diamond single-crystal tip cantilevers for electrical and mechanical scanning probe microscopy
Ewelina Gacka,P. Kunicki,5 Authors,K. Kwoka
2021 · DOI: 10.1016/j.measurement.2021.110373
8 Citations