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Design Challenges and Optimization Strategies for High-Speed Connector Test Fixtures

Qingfeng Lin,Dao Lin,Lei Deng,Yihong Qi

2025 · DOI: 10.1109/WAI67900.2025.11309298
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Abstract

With the evolution of communication protocols such as PCIe and Ethernet toward higher speeds, test fixtures— the intermediate interconnect tools for verifying connector performance—face stringent challenges in core metrics: insertion loss (IL), crosstalk, and skew. This paper analyzes the technical bottlenecks of current test fixtures in high-frequency scenarios, relates them to recent protocol roadmaps (e.g., PCIe Gen6/Gen7 and 112G/224G Ethernet), and proposes practical future design optimizations.