De-sensitization Design and Analysis for Highly Integrated RFSoC and DRAM Stacked-Die Design
De-sensitization Design and Analysis for Highly Integrated RFSoC and DRAM Stacked-Die Design
Sheng-Mou Lin,Chih-Chun Hsu,4 Authors,Charles Chen
2018 · DOI: 10.1109/ECTC.2018.00201
Electronic Components and Technology Conference · 1 Citations