Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
Characterizing Ferroelectricity with an Atomic Force Microscopy: An All-Around Technique
S. Martin,B. Gautier,4 Authors,A. Gómez
2019 · DOI: 10.1007/978-3-030-15612-1_6
0 Citations