Atomic Force Microscopy
Atomic Force Microscopy
Weston Straka
2020 · DOI: 10.1007/978-1-4939-8894-5
29 Citations
TLDR
A simple, accurate and robust methodology was established and is here presented, for the assembling of DNA sensors on the unoxidized, crystalline Si(100) surface, by loading controlled amounts of a monolayer DNA-probe through a two-step procedure.