Differential structured illumination microscopy for high-throughput, wide-field 3D computational phase imaging
Differential structured illumination microscopy for high-throughput, wide-field 3D computational phase imaging
Alex Matlock,Z. Yaqoob,Peter T. C. So
2023 · DOI: 10.1364/cosi.2023.cm3b.7
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TLDR
dSIM is presented, a new modality utilizing differential image acquisitions with darkfield-based patterned illumination to provide high-resolution, large field-of-view 3D computational phase imaging with linear inverse scattering models.
Abstract
We present differential structured illumination microscopy (dSIM), a new modality utilizing differential image acquisitions with darkfield-based patterned illumination to provide high-resolution, large field-of-view 3D computational phase imaging with linear inverse scattering models.